Electron Microscope
 [manual] |
Transmission Electron Microsope (JEM-120i, JEOL) | |
|
||
 [manual] |
Scanning Electron Microsope (JSM-IT210, JEOL) | |
|
|
||
 [manual] |
オスミウムコーティングシステム (Tennant20, メイワフォーシス) | |
|
|
||
      |
TEM sample preparation 201405_Arnon |
|
|
||
Contact:
Prof. Minoru FUJII
Department of Electrical and Electronic Engineering, Graduate School of
Engineering, Kobe University
Rokkodai, Nada, Kobe 657-8501, Japan
